Document Type

Book Chapter

Publication Date

2-15-2019

Publication Title

Encyclopedia of Analytical Sciences 3rd edition

Volume

10

Pages

449-458

Publisher Name

Elsevier

Abstract

Total reflection X-ray fluorescence spectrometry (TXRF) is a trace elemental micro analysis technique based on conventional energy dispersive X-ray fluorescence. It has become increasingly popular in the last few decades and is applied in almost every field of trace elemental analysis where low detection limits and multi element capabilities are required. Like all X-ray techniques TXRF is non-destructive making it highly useful and important in areas where samples are precious and/or need to be available for further characterization. The ability of probing extremely small sample amounts makes TXRF a superior analytical technique for samples of limited amount. New table top instruments make this technique affordable and versatile as it can be used for field research as well as process monitoring in industrial settings without requirements like vacuum or cooling water circuits. In the semi-conductor industry TXRF is routinely applied to scan wafers for impurities on the surface and in near surface layers.9 This article introduces the basic principle of TXRF, its instrumental features, and discusses various applications of this technique. For a more in-depth treatment of the topic the reader is referred to the book of Klockenkämper and von Bohlen and the reviews of Streli and Wobrauschek listed under suggested further reading.

Identifier

9780081019832

Comments

Author Posting © Elsevier, 2019. This article is posted here by permission of Elsevier for personal use, not for redistribution. The article was published in Encyclopedia of Analytical Sciences 3rd edition, Volume 10, February 2019, https://www.elsevier.com/books/encyclopedia-of-analytical-science/worsfold/978-0-08-101983-2

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This work is licensed under a Creative Commons Attribution-Noncommercial-No Derivative Works 3.0 License.

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